Survey of sub-electron noise CMOS image sensors
Year: 2024
Type: conference-paper
Source: Lirias
Authors: Wakale, Prayag, Tavernier, Filip, Dierickx, Bart, Wakale, Prayag Jaysing
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7052972278
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