Work

Quantum Metrology

Year: 2006

Type: article

Abstract: We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

Source: Physical Review Letters

DOI: 10.1103/physrevlett.96.010401

Authors: Vittorio Giovannetti, Seth Lloyd, Lorenzo Maccone

Institutions: Scuola Normale Superiore, National Enterprise for NanoScience and NanoTechnology, Massachusetts Institute of Technology, University of Pavia

Language: English

Topic: Quantum Information and Cryptography

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W3037089521

FWCI: 18.78

Cites: 22

Cited by: 2,506

Related to: 10