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Reliability Under Stress: The Impact of Localized Aging on RO-PUF Architectures in FPGAs

Year: 2025

Type: conference-paper

Abstract: International audience

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Douadi, Aghiles, Vatajelu, Ioana, Maistri, Paolo, Hély, David, Beroulle, Vincent, Di Natale, Giorgio

Institutions: Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Laboratoire de Conception et d'Intégration des Systèmes

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

Funder: Agence Nationale de la Recherche

Award: Power-OFF laser attacks on security Primitives

OpenAlex ID: W7061879844

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