Work

In Situ Thermal Imaging of Threshold Switching Devices

Year: 2024

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Puyoo, Etienne, Albertini, David, Baboux, Nicolas, Nandi, Sanjoy Kumar, Das, Sujan Kumar, Elliman, Robert Glen

Institution: Institut des Nanotechnologies de Lyon

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7061892291

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