Work

Correlative TOF-SIMS & XPS for the analysis of dopants for organic light-emitting diodes layers

Year: 2024

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Guyot, Claire, Barnes, Jean-Paul, Renault, Olivier, Mariolle, Denis, Maindron, Tony

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7064830299

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