From Departure to Breach: The Impact of IT Employee Turnover on Cybersecurity Risks
Year: 2024
Type: article
Authors: Liang, Zhewen, Xu, Shan, Chen, Dylan Junluo, Li, Jin, Liu, Ben
Language: English
Subfield: Information Systems
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7064887294
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