Work

On the Importance of Appropriate Current Probes for Double Pulse Tests and How to Select Them

Year: 2025

Type: conference-paper

Source: Publication Server of Bonn-Rhein-Sieg University of Applied Sciences (Bonn-Rhein-Sieg University of Applied Sciences)

DOI: 10.30420/566541014

Authors: Sprunck, Sebastian, Lutzen, Hauke, Kaminski, Nando, Jung, Marco

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7076053656

FWCI: 4.65

Cites:

Cited by: 2

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