Methodology for Obtaining Speckle Interferometry through Lateral and Angular Displacement
Year: 2025
Type: article
Abstract: Interferometry is a highly useful tool in metrology, and speckle interferometry allows for measurements with micrometer-level resolution. In the following pages of this document, the standard technique or methodology will be presented to obtain interference fringes caused by lateral or angular displacement. That is, a diffractive element (such as a negative or photographic film) can be obtained by taking a double exposure photograph of an object in an initial position and then in a second position, thus causing a displacement. When this grating is illuminated with a laser beam and aided by an optical system, interference fringes can be observed on a screen. The position, thickness, and spacing of these fringes provide the necessary information to calculate the lateral or angular displacement.
Author: Josué del Valle-Hernández, J. Felix López Rocha, Alejandro García Trujillo, José Alfredo Gasca González, Adrian Pérez-Benavidez, Edgardo Picon Rodríguez, Mauricio Valtierra Domínguez, F.Alejandro Ramírez Díaz
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7081950647
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