Shear Coupled Grain Boundary Migration in Al UFG: data from EBSD, AFM and ACOM TEM
Year: 2025
Type: article
Abstract: Data files : EBSD & AFM maps before and after creep test (+ SEM images). ACOM orientation maps for in-situ TEM observations. Format: EBSD (.ctf files), AFM (Gwyddion), ACOM-TEM (.ctf files)
Authors: Gautier, Romain, Mompiou, Frederic, Renk, Oliver, Coupeau, Christophe, Combe, Nicolas, Seine, Grégory, Legros, Marc
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
Funder: Agence Nationale de la Recherche
OpenAlex ID: W7081998786
