Work

Bias-Dependent TID Effects and Annealing Recovery in Power COTS GaN HEMTs

Year: 2025

Type: conference-paper

Source: INRIA a CCSD electronic archive server

Authors: Couillaud, Hadrien, Gaillardin, Marc, Artola, Laurent

Institutions: Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA DAM Île-de-France, Office National d'Études et de Recherches Aérospatiales, Université de Toulouse

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7083350970

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