Work

2DIO: Configurable and Cache-Accurate Trace Generation for Storage Benchmarking

Year: 2026

Type: conference-paper

Abstract: We present 2DIO, a trace generator creating cache-accurate, stressful I/O workloads. While existing tools are limited to generating traces with well-behaved, concave hit ratio curves, 2DIO produces ones with tunable complex cache behaviors, particularly performance cliffs and plateaus.

Source: European Conference on Computer Systems

DOI: 10.1145/3767295.3769391

Authors: Yirong Wang, Isaac Khor, Peter Desnoyers

Institution: Northeastern University

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: hybrid

Funders: National Science Foundation, VMware

Award: CNS Core: Small: Byte-Addressable I/O Everywhere

OpenAlex ID: W7083585016

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