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Lightweight Small Defect Detection with YOLOv8 Using Cascaded Multi-Receptive Fields and Enhanced Detection Heads

Year: 2025

Type: article

Abstract: In printed circuit board (PCB) manufacturing, surface defects can significantly affect product quality. To address the performance degradation, high false detection rates, and missed detections caused by complex backgrounds i... | Find, read and cite all the research you need on Tech Science Press

Source: Computers, materials & continua/Computers, materials & continua (Print)

DOI: 10.32604/cmc.2025.068138

Authors: Shengran Zhao, Zhensong Li, Xiaotan Wei, Yutong Wang, Kai Zhao

Institution: Beijing Information Science & Technology University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: diamond

OpenAlex ID: W7083632223

FWCI: 0.507

Cites:

Cited by: 1

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