Automatic On-Wafer Probe Positioning System Based on Convolutional Neural Network Model
Year: 2025
Type: conference-paper
Authors: Z. Gao, A. Daalman, F. Mubarak, C. Gao, C. De Martino, S. Lehmann, M. Spirito
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: European Commission
OpenAlex ID: W7084043370