Data-driven robust adaptive control based on multi-step error feedback for silicon single crystal diameter control in Czochralski process
Year: 2025
Type: conference-paper
Authors: Jun-Chao Ren, Ding Liu, Yin Wan
Institution: Xi'an University of Technology
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7084054953
