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A Novel Deep-Broad Learning Network for Mixed Wafer Map Defect Recognition

Year: 2025

Type: conference-paper

Source: Youth Academic Annual Conference of Chinese Association of Automation (YAC)

DOI: 10.1109/yac66630.2025.11150303

Authors: Qingchun Zhou, Mengqiu Song, Lei Yang

Institution: Zhengzhou University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W7084055014

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Cites: 24

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