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VNA-Based in-Band Spectral Purity Assessment for MM-Wave Frequency Extenders

Year: 2025

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg65332.2025.11168129

Authors: C. De Martino, M. Spirito

Institution: Delft University of Technology

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084060391

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