Work

USB 3.0 IBIS-AMI Model Construction Using Measurement and Neural Network

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170225

Authors: Jiahuan Huang, Wenchang Huang, Muqi Ouyang, Hank Lin, Bin-Chyi Tseng, Chulsoon Hwang

Institutions: Missouri University of Science and Technology, Asus (Taiwan)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science Foundation

Award: Phase III IUCRC at Missouri University of Science and Technology: Center for Electromagnetic Compatibility

OpenAlex ID: W7084064929

FWCI:

Cites: 11

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