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Revitalizing Digitized Historical Collections: AI-Driven Quality Control with Locally Trained Computational Models

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Software Engineering and Artificial Intelligence (SEAI)

DOI: 10.1109/seai65851.2025.11108755

Authors: Vincent Wai-Yip Lum, Siu Sun Chung

Institution: Chinese University of Hong Kong

Language: English

Topic: Handwritten Text Recognition Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084071749

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Cites: 20

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