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Image Denoising for Wafer Transmission Electron Microscopy Using Segment Anything-Guided Optimization

Year: 2025

Type: conference-paper

Source: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)

DOI: 10.1109/case58245.2025.11164008

Authors: Sungsu Kim, Gunhui Jang, Hansam Cho, Heejoong Roh, Kyunghye Kim, Munki Jo, Jaeung Tae, Seoung Bum Kim

Institutions: Korea University, SK Hynix (South Korea)

Language: English

Topic: Image and Signal Denoising Methods

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084073811

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Cites: 17

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