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Minimizing System Drift in mmWave Wafer-Level Testing with Active Thermal Management

Year: 2025

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg65332.2025.11168140

Authors: Shania Hsieh, Matt Lu, Hung Che Fu, Stojan Kanev, Andrej Rumiantsev

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084074550

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Cites: 1

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