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An Early Comparison of D-Band and G-Band On-Wafer Noise Figure Measurements

Year: 2025

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg65332.2025.11168143

Authors: Nizar Messaoudi, Shengjie Gao, Muhammad Waleed Mansha, Yves Baeyens, Slim Boumaiza, Bryan Hosein, Shahriar Shahramian

Institutions: Keysight Technologies (United States), Focus Microwaves (Canada), University of Waterloo

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084113763

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Cites: 13

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