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Optimization of Few-Shot IC Chip Defect Detection Model Based on YOLOV11

Year: 2025

Type: conference-paper

Source: Youth Academic Annual Conference of Chinese Association of Automation (YAC)

DOI: 10.1109/yac66630.2025.11150266

Authors: Dongmei Lin, Xuexiang Zhang, Yujie Fan

Institution: Lanzhou University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084134897

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Cites: 9

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