Work

On-Wafer Cryogenic RF Noise Measurement Techniques

Year: 2025

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg65332.2025.11168144

Authors: Jean-Olivier Plouchart, Daniil Frolov, Utku Soylu, Alberto Valdes-Garcia

Institutions: IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7084153778

FWCI:

Cites:

Cited by:

Related to: