Defect Detection in Printed Circuit Boards: A Comparative Analysis of Object Detection Models with Depthwise Convolution Adaptation
Year: 2025
Type: article
Source: IEEE Latin America Transactions
Authors: Julio Martins, Josue Lopez-Cabrejos, Quefren Leher, Thuanne Paixão, Ana Beatriz Alvarez, Facundo Palomino-Quispe
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7084756121