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AF Det: An Attention Fusion Convolutional Network for High Fidelity Industrial Defect Detection

Year: 2025

Type: conference-paper

Source: International Conference on Robotics, Artificial Intelligence and Intelligent Control (RAIIC)

DOI: 10.1109/raiic65850.2025.11169777

Authors: Junyuan Deng, Guanchun Mao

Institution: South China Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7084897693

FWCI: 2.48

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Cited by: 1

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