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Feature-Scale Attentive Pseudo-Labeling for Semi-Supervised Wafer Map Defect Segmentation

Year: 2025

Type: conference-paper

DOI: 10.1109/icsip65915.2025.11171457

Authors: Mohammad Mehedi Hasan, Naigong Yu, Imran Khan Mirani, Md Mizanur Rahman Mustakim

Institutions: Beijing University of Technology, Beijing Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7085611475

FWCI: 2.454

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Cited by: 1

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