Work

A Broadband Dual-Component Magnetic Probe With a New Structural Design for EMI Diagnostics

Year: 2025

Type: article

Source: IEEE Transactions on Components Packaging and Manufacturing Technology

DOI: 10.1109/tcpmt.2025.3619541

Authors: Enming Luo, Xinyu Lu, Xiyou Sun, Lei Wang

Institutions: Xidian University, China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7086798624

FWCI: 0.68

Cites: 34

Cited by: 3

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