Work

In-Situ Metrology for Roll-to-Roll Microcontact Printing via Condensation Figures and YOLOv8

Year: 2025

Type: article

Source: IEEE Transactions on Industrial Informatics

DOI: 10.1109/tii.2025.3614216

Authors: Xiangdong Xie, Jingyang Yan, Rui Ma, Xian Du

Institution: University of Massachusetts Amherst

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W7087024854

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Cites: 30

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