The research on surface defect detection method of circuit board based on convolutional neural network
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Yanli Zhao, Haoran Zhang
Institution: Ningxia Institute of Science and Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7089341122
FWCI:
Cites:
Cited by:
Related to:
