-Supplementary Material- Exemplar-specific Patch Features for Fine-grained Recognition
Year: 2015
Type: article
Authors: Er Freytag, Erik Rodner, Trevor Darrell, Joachim Denzler, A. Freytag, E. Rodner, T. Darrell, J. Denzler
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7096084954
