c ° 2000 Kluwer Academic Publishers. Manufactured in The Netherlands. Single View Metrology
Year: 2014
Type: article
Authors: A. Criminisi, I. Reid, A. Zisserman
Language: English
Topic: Advanced Vision and Imaging
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7096227543