Work

In-Situ Transmission Electron Microscopy Analysis of Conductive Filament in Resistance Random Access Memories

Year: 2016

Type: article

Authors: Yasuo Takahashia, Takashi Fujiia, Masashi Aritaa, Ichiro Fujiwarab

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7099608566

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Related to: 10