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Unsupervised and few-shot segmentation in photovoltaic electroluminescence images for defect detection via a novel enhanced iterative autoencoder with simple implementation

Year: 2025
Type: article
Abstract: PVEL images are particularly valuable for ML-based automated fault detection. A novel EI-AE incorporates an iterative mechanism into the conventional AE framework, providing simple, effective unsupervised pixel-level defect segmentation.
Authors: Ye Lin, Pingyang Sun, Rongcheng Wu, Shu Geng, Man Lung Yiu, Zhidong Li, Fang Chen, Yu Gao, Mingzhe Wang, Kaiwen Sun, Xiaojing Hao
Language: English
Open Access status: hybrid
OpenAlex ID: W7106699566
FWCI: 0.507
Cites: 39
Cited by: 1
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