Unsupervised and few-shot segmentation in photovoltaic electroluminescence images for defect detection via a novel enhanced iterative autoencoder with simple implementation
Year: 2025
Type: article
Abstract: PVEL images are particularly valuable for ML-based automated fault detection. A novel EI-AE incorporates an iterative mechanism into the conventional AE framework, providing simple, effective unsupervised pixel-level defect segmentation.
Source: Energy & Environmental Science
DOI: 10.1039/d5ee05042a
Authors: Ye Lin, Pingyang Sun, Rongcheng Wu, Shu Geng, Man Lung Yiu, Zhidong Li, Fang Chen, Yu Gao, Mingzhe Wang, Kaiwen Sun, Xiaojing Hao
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Awards: G2238053653, G6237293519, G6744244746
OpenAlex ID: W7106699566
