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Performance Analysis of Vertical Embedded Gate-Gate All Around FET with Quantum Confinement Effects

Year: 2025

Type: article

Source: Russian Microelectronics

DOI: 10.1134/s1063739725600372

Authors: Amit Saini, Vishal Narula, Sangeeta Mangesh

Institution: Lovely Professional University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7106795781

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Cites: 45

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