Year: 2025
Type: conference-paper
Abstract: In this study, we present a new quantification method for surface concentrations of lunar dust and lunar simulant. This technique demonstrates the use of portable X-ray fluorescence spectroscopy (pXRF) to quantify surface lunar dust loading on surfaces using an adaption of existing pXRF techniques and is the first demonstration of a high accuracy and precision tool designed to quantify lunar dust loading in-situ on large surfaces within seconds. This study shows the background in current methodologies for quantification of lunar dust in tests as well as current and potential future techniques for lunar surface missions, as well as current applications of commercial off-the-shelf (COTS) pXRF technology. The methodology for adapting current pXRF techniques is presented, followed by a demonstration of this new method on a variety of materials and test campaigns related to spaceflight or lunar surface missions. This technique shows high fidelity for immediate utilization as well as a demonstration of high potential for future surface missions. Potential current uses can include development and qualification testing, as well as requirement verification and validation. Included future work outlines calibration adjustments to make this technique more adaptable and hardware developments for eventually using this tool during lunar missions.
Authors: Joshua H. Joshua H., Sonali R. Nagpal, Michael W. Hull
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W7108439612
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