Work

Integrated Short-Circuit Protection Method in On-State Voltage Measurement Circuit for SiC MOSFETs

Year: 2025

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2025.3643142

Authors: Jiahong Liu, Xing Wei, Bo Yao, Yichi Zhang, Yingzhou Peng, Huai Wang

Institutions: State Grid Jiangsu Electric Power (China), Aalborg University, Hunan University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Innovationsfonden

OpenAlex ID: W7114771979

FWCI: 0.231

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Cited by: 1

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