Year: 2025
Type: article
Abstract: Photon-counting polarimetric imaging provides more dimensional information compared to conventional imaging systems.We present a compact dual-wavelength infrared polarimetric light detection and ranging system operating at 1550 and 2004 nm, utilizing direct detection with superconducting nanowire single-photon detectors.This system achieves millimeter-scale resolution in both lateral and axial dimensions at a target distance of ∼1.3 m.Experimental results demonstrate an improved material discrimination advantage at low photon flux by integrating dual-band photon counting detection with polarimetric imaging, outperforming traditional intensity-based measurement methods.This work demonstrates broad application prospects in scenarios involving mid-infrared remote sensing and complex environmental exploration.
Source: Chinese Optics Letters
Authors: Lichao Peng, Youshuo Cui, Yuzhuo Li, Guangxiao Hu, Yanzhou Chen, Yunkun Zhao, Yun Wang, Zhonghuai Wu, Kemi Xu, Weiqian Zhao
Institution: Beijing Institute of Technology
Language: English
Subfield: Instrumentation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
Award: G5621144317
OpenAlex ID: W7114893161