Work

Synchrotron X-ray topography investigation on dislocation propagation in heavily arsenic-doped silicon crystal necks

Year: 2025
Type: article
Abstract: Publisher Copyright: © 2025 The Authors
Authors: A. Lankinen, T.O. Tuomi, O. Anttila, S. Sintonen, P. Kostamo, P.J. McNally, C. Paulmann
Language: English
Open Access status: hybrid
Estimated APC paid: $3,110
OpenAlex ID: W7115022086
FWCI: 0.385
Cites: 7
Cited by: 1
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