Work

Neutron Low Energy and Laser responses in Photodiodes for SEE Assesment

Year: 2024

Type: conference-paper

Abstract: In this work we present a calibration method of pulsed laser energy to get the same (photo)ionization as the ionization due to a neutron induced nuclear reaction in silicon. Pulsed lasers are well known to produce single event effects (SEE) in electronics and detectors because there is a good correlation between the column photoionization and the trace ionization produced by a charged particle hitting a silicon device. In the case of neutron impact, the correlation is not so clear as the ionization is produced inside of the device by the ejectiles of a nuclear reaction. The final objective of this calibration is to reproduce neutron SEE in devices using pulsed lasers in an electronics laboratory.

Source: European Conference on Radiation and Its Effects on Components and Systems

DOI: 10.1109/radecs61970.2024.11298576

Authors: F. R. Palomo, R. Ascazubi, A. C. Vilas-Bòas, J. Jiménez-Sánchez, C. Soldano, B. Fernández, C. Guerrero

Institutions: Universidad de Sevilla, Intel (United States), Centro Universitário FEI, Aalto University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W7116868461

FWCI:

Cites: 10

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