Work

Analytical Impact of Temperature on Ferroelectric Junction‐Less Surrounding‐Gate FET: Electrical Perspective

Year: 2025

Type: article

Source: International Journal of Numerical Modelling Electronic Networks Devices and Fields

DOI: 10.1002/jnm.70135

Authors: Shalu Garg, Jasdeep Kaur, Anubha Goel, R. S. Gupta, Subhasis Haldar

Institutions: Indira Gandhi Delhi Technical University for Women, University of Delhi

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7117314562

FWCI: 0.227

Cites: 32

Cited by: 1

Related to: