Work

Self‐Healing Metal Circuits via Controlled Electrochemical Migration: Turning A Reliability Hazard Into an Automatically Triggered and Repeatable Repair Strategy

Year: 2025
Type: article
Authors: Fei Gao, Wei Jie Mo, Ze Ping Zhang, Min Zhi Rong, Ming Qiu Zhang
Language: English
Open Access status: closed
OpenAlex ID: W7117355763
FWCI: 0.234
Cites: 50
Cited by: 1
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