Self‐Healing Metal Circuits via Controlled Electrochemical Migration: Turning A Reliability Hazard Into an Automatically Triggered and Repeatable Repair Strategy
Year: 2025
Type: article
Source: Advanced Functional Materials
Authors: Fei Gao, Wei Jie Mo, Ze Ping Zhang, Min Zhi Rong, Ming Qiu Zhang
Institution: Sun Yat-sen University
Language: English
Subfield: Polymers and Plastics
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Awards: G4442975084, G7204012324
OpenAlex ID: W7117355763
