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A hybrid model for structured illumination microscopy reconstruction using attention mechanism and deep Laplacian pyramid network with Fourier loss

Year: 2025

Type: article

Source: Journal of Microscopy

DOI: 10.1111/jmi.70057

Authors: Sarfaraj Mirza, Vivek Bohane, Balpreet S. Ahluwalia, Renu John

Institutions: Indian Institute of Technology Hyderabad, National Institute of Technology Rourkela, UiT The Arctic University of Norway

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Indian Council of Medical Research

Award: G1245338419

OpenAlex ID: W7117543789

FWCI:

Cites: 21

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