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Hot-FV: A Semi-Formal Test Generation Framework for RTL Functional Coverage Using Warm Starting States

Year: 2025

Type: conference-paper

Source: Proceedings, IEEE International Conference on Computer Design/Proceedings - IEEE International Conference on Computer Design

DOI: 10.1109/iccd65941.2025.00049

Authors: Ziyue Zheng, Zhiyuan Yan, Xiangchen Meng, Guangyu Hu, Hongce Zhang, Yangdi Lyu

Institutions: The Hong Kong University of Science and Technology (Guangzhou), Hong Kong University of Science and Technology

Language: English

Topic: Formal Methods in Verification

Subfield: Computational Theory and Mathematics

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7117568362

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Cites: 26

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