Work

Three-dimensional mapping of electrical behavior in perovskite films using tomographic conductive atomic force microscopy

Year: 2025

Type: article

Abstract: Passivation treatments are crucial for improving the performance of perovskite solar cells by reducing non-radiative recombination and enhancing charge transport. However, their microscopic effects within the perovskite films remain unclear due to limitations of conventional characterization methods. This study uses three-dimensional tomographic conductive atomic force microscopy to examine the structural and electrical properties of perovskite films treated with different passivation strategies. Through 3D current mapping and quantitative analysis, we identify internal electrical pathways and structural defects. While untreated films exhibit high-resistance regions that hinder carrier transport, bulk passivation reduces these regions, particularly in the film interior, thereby enhancing grain boundary conductivity. Surface passivation primarily mitigates near-surface defects, improving local conductivity. Combining both strategies results in a more conductive internal structure, with high-resistance regions confined to the top surface. These findings highlight how passivation treatments improve perovskite film quality, directly correlating with enhanced solar cell performance.

Source: Newton

DOI: 10.1016/j.newton.2025.100367