Ion-beam milling induced systematic error in correlative microscopy of Li-ion battery materials
Year: 2026
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0300323
Authors: Sergey Yu. Luchkin, Egor M. Pazhetnov
Institution: Skolkovo Institute of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7119082510