Work

Nickel-oxide hole-transport layers prevent abrupt reverse-bias breakdown and permanent shorting of perovskite solar cells caused by pinhole defects

Year: 2026

Type: article

Abstract: 30-nm-thick sputtered nickel oxide hole-transport layers decrease the likelihood of abrupt reverse-bias breakdown, permanent shorting, and severe thermal damage in perovskite solar cells.

Source: EES solar.

DOI: 10.1039/d5el00206k

Authors: Daniel A. Morales, Collin Sindt, Kell Fremouw, Kaitian Mao, Matteo Poma, Thomas Stewart, Ryan A. DeCrescent, Michael D. McGehee

Institution: University of Colorado Boulder

Language: English

Topic: Perovskite Materials and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: diamond

Funders: National Science Foundation, University of Colorado Boulder, Division of Materials Research

Awards: G3440218188, Triple Halide Ultrawide Bandgap Metal Halide Perovskites

OpenAlex ID: W7122542038

FWCI: 8.386

Cites: 24

Cited by: 5

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