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Erratum to: Interface Trap-Induced Impact in Linearity and Small-Signal Performance of InAs-Channel TFETs: Reliability Implications

Year: 2025

Type: erratum

Abstract: An Erratum to this paper has been published: https://doi.org/10.1134/S102833582501001X

Source: Doklady Physics

DOI: 10.1134/s102833582501001x

Authors: Vedvrat, Rajeev Kumar Sachan

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W7123340773

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