Work

Analysis of Practical Paralleling Limits in SiC MOSFETs under Parameter Mismatch

Year: 2025

Type: conference-paper

Source: International Conference on Electrical Machines and Systems (ICEMS)

DOI: 10.23919/icems66262.2025.11317284

Authors: Junhyeok Jegal, Chang-Yeol Oh, Youngju Park, Jong-Pil Lee

Institution: Korea Electrotechnology Research Institute

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Council

OpenAlex ID: W7123362225

FWCI:

Cites: 17

Cited by:

Related to: