Work

A weakness breakdown model of a BOPP film based on blister growth under cyclic pulsed voltage

Year: 2026

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0310856

Authors: Yunxiao Zhang, Jiaxin Liu, Jiarui Zhang, Yuhao Liu, Hao Hu

Institutions: Fuzhou University, Tsinghua University

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8959178813

OpenAlex ID: W7123556047

FWCI: 2.893

Cites: 24

Cited by: 2

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