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SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences

Year: 2026

Type: article

Source: International Journal of Pattern Recognition and Artificial Intelligence

DOI: 10.1142/s0218001426500011

Authors: Hongjuan Kang, Bing Guo, Ying Luo, Na Shi

Institutions: Sichuan University, Changhong (China)

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China

Awards: G125766122, G8419899601

OpenAlex ID: W7123791924

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Cites: 13

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